The AQ7420 precisely identifies both the location and magnitude of reflections within optical connectors and modules, revealing microcracks or misalignments that standard loss measurements often miss.
Compared to OFDR-based Optical Backscatter Reflectometer (OBR) or OCWR methods, the AQ7420 delivers sharper, spurious-free waveforms, making it ideally suited for high-precision inspection. These capabilities are particularly valuable for reliability testing of components subjected to prolonged high-temperature operation, where hidden defects can cause premature failure. When paired with the optional sensor head unit, it can also measure insertion loss simultaneously, providing a versatile solution for both R&D and production environments.
Spurious Noise Reduction
With some conventional reflectometers, spurious noises may falsely appear in areas where there is no actual reflection. Waveform analysis often requires that users have specialized knowledge of this sort of phenomena. The AQ7420 greatly reduces spurious noises and simplifies analysis.
- Measurement distance: 100 mm (approx. 4 inches)
- Spatial resolution: 40 μm
- Spurious noise: −100 dB avoids false (ghost) effects
Simultaneous Measurement of Multiple Reflection and Insertion Loss
Traditionally, reflectometers have been inadequate for inspection of reflection attenuation due to poor measurement accuracy of the vertical axis (back reflection). The AQ7420 enables measurement with an uncertainty of ±3dB, and using the optical sensor head, connector connection loss can be measured simultaneously with an uncertainty of ±0.02 dB.
Multi-Fiber Measurement
By combining with the optional multi-switch unit, multi-fiber measurement becomes available.
Channel switching time: 1 sec
Channel switching repeatability: ±0.02 dB
Insertion loss: ≤ 2.6 dB
Microcrack Analysis for Optical Connectors
The AQ7420 simultaneously measures breaks, cracks, losses, and reflections of optical connectors.