Yokogawa AQ6376 Three Micron OSA 1500 - 3400 nm

MWIR Wavelenght with internal gas purge and cut filter

The AQ6376 is the latest version of our bench-top optical spectrum analyzer extending the wavelength coverage well beyond the NIR range of our previous models into the MWIR region from 1500 to 3400 nm.

Popular applications include the detection of gases such as carbon oxides (COx), nitrogen oxides (NOx), and hydrocarbon gas (CxHy) for environmental studies.

Similar to the long wavelength model, it offers the added benefits of gas purging input ports / output ports, a built-in cut filter for high order diffracted light, and a novel double speed mode which increases the sweep speed up to 2 times compared to the standard sweep mode.

Key feature summary

  • Long wavelength range: 1500 to 3400 nm
  • Gas purging ports to reduce water vapor effects
  • Built-In cut filter for high order diffracted light
  • Double Speed Mode to further enhance fast measurement speed
  • High sensitivity down to -65 dBm
  • High resolution to 0.10 nm
  • Wide close-in dynamic range (55dB)
  • Fast auto-calibration
  • Free space optical input for maximum flexibility, low maintenance, and high reliability
  • Applicable to single-mode and multimode fibers
  • Excellent performance for environmental gas sensing Laser Spectroscopy
  • Indispensable tool for R&D and manufacturing of optical devices in the wavelength range from telecom band to 3.4μm

New Purge feature
Due to the high resolution and sensitivity of the AQ6376, it can actually detect the presence of water molecules in the air. The water vapor is detected in the upper Near-IR wavelength region and could overlap with or mask the spectral characteristics of the actual device under test in that particular region.

By continuously supplying a pure purge gas such as nitrogen to the monochromator through the ports on the back panel, the AQ6376 can reduce the influence of water vapor absorptions and provide more reliable and accurate measurements than ever before.

New Built-in cut filter for high order diffracted light
Due to the diffractive technology used, the monochromator in some circumstances could generate high order diffracted light, which appears at wavelengths equal to the integral multiple of input wavelengths.

By cutting incoming light below 1500 nm with the built-in filter, the AQ6376 drastically reduces the influence of high order diffracted light on the measurement. Thus, the measured data are always reliable and replicate the real signal under test.

New Double speed mode
Increases the sweep speed up to 2 times compared to the standard sweep mode, with only a 2 dB penalty to the standard sensitivity value

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