Netscope provides measurement solutions suitable for the nanotechnology market and applications.
Netscope cooperates with the world leading manufacturers in nanotechnology measurement systems such as :
1- Keysight Technologies
2- Polytec
3- FormFactor
Manufacturers specializing in this field:
Indicative products applicable to Nanotechnology Applications (click on a product's title for details):
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Cascade Elite 3000 probe station**The Next Step in 300 mm Probing** In step with the ITRS roadmap at 45nm and below, the Elite 300 overcomes measurement challenges brought on by increased device complexity, smaller pad sizes, and lower voltages. The Elite 300 delivers unprecedented stepping accuracy and wafer planarity over the full temperature range. It also provides the world's lowest-noise "Quiet" environment, and ensures low-leakage, low-capacitance measurements. **Velox™ probe station control software** • Intuitive GUI for efficient system utilization by novice and expert users • Software joystick for precise, sub-micron positioning • Improved sub-die navigation with CellView • Easy integration with instrument, testers, and test and measurement software for fast data collection **Powerful automation tools for data collection** • Automatic wafer alignment • Auto XYZ and theta correction for sub-micron stepping • Automatic die size measurement toolmore...
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Keysight B1500A Semiconductor Parameter Analyzer**Keysight B1500A Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe** Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time **Measurement capabilities** - Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 µV - 200 V - AC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilities - Advanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s) - Up to 40 V high voltage pulse forcing for non-volatile memory evaluation **EasyEXPERT group+ software** - EasyEXPERT group+ characterization environment is available either on mainframe with 15 inch touch screen (embedded Windows 7) or on user’s PC - Multiple measurement modes for quick setup and measurement execution (application test, classic test, tracer test, quick test and oscilloscope view) - Graphical display, automated analysis capabilities and data generation to Excel and image for analysis and reporting - EasyEXPERT group+ can be installed on as many PCs as you need without additional charge to take advantage of offline personal analyzer environment among users in your department. **Mainframe features** - Configurable and upgradeable measurement modules up to 10 slots in a box - 15-inch wide touch screen supports intuitive GUI operation of the EasyEXPERT group+ - Windows Embedded Standard 7 (WES7) - GPIB, USB, LAN interfaces, and VGA video output portmore...
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Keysight B2900B/BL Precision Source/Measure Unit**Keysight B2900B/B2900BL Series Precision Source/Measure Unit** The Keysight B2900B/BL Series Precision Source/Measure Units are compact and cost-effective bench-top Source/Measure Units (SMUs) with the capability to source and measure both voltage and current. These capabilities make the B2900B/BL Series SMU ideal for a wide variety of IV (current versus voltage) measurement tasks that require both high resolution and accuracy. The B2900B/BL Series SMU has a voltage maximum of ±210 V, a current maximum ±3 A DC, and ±10.5 A pulsed sourcing capabilities. With a precision minimum of 10 fA/100 nV sourcing and measuring resolution, a color LCD graphical user interface (GUI) and several task-based viewing modes will improve your productivity for test, debug, and characterization. Some advantages of the **Keysight B2900B/BL Series** SMU include: - Testing up to 210 V and 3 A (DC) or 10.5 A (pulsed) with a single instrument - Source and measurement resolution - 10 fA and 100 nV - Integrated sweep and arbitrary waveform measurement functionality - Capturing transient phenomena effortlessly - 4-wire measurement capability permits accurate low resistance measurement - Measurement of large capacitive loads without oscillation - Best-in-class measurement throughput The B2900B/BL Series SMU offers multiple options for instrument remote control at little or no cost. Four solutions are available: **BenchVue**, **B2900B/BL Graphical Web Interface**, **B2900 Quick IV Measurement Software**, and **EasyEXPERT group+**. These multiple software control options allow you to choose the solution that best fits your particular application. The B2900B/BL Series SMU has a broad application range that spans uses from R&D and education to industrial development, production test and automated manufacturing. Moreover, they work equally well as either standalone or system components. Application areas include: - Testing semiconductors, discrete and passive components - Testing precision electronics and green energy devices - Research and education Learn more about the new **Keysight B2900B/B2900BL Precision Source Measure Units** Get the technical data sheet of the new **Keysight B2900B/B2900BL Precision Source Measure Units**more...
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Keysight B2983A Femto / PicoammeterB2980A Series Femto / Picoammeters and Electrometers / High Resistance Meters The B2980A series of Femto/Picoammeters and Electrometers/High Resistance Meters not only offer best-in-class measurement performance, but also provide unprecedented features to maximize your measurement confidence. Both the picoammeters and electrometers provide a world-best performance of 0.01 fA (0.01 x 10-15 A) current measurement resolution. In addition, the electrometers can measure resistance up to 10 PΩ (10 x 1015 Ω), which is also a best-in-class specification. Finally, since AC power line noise can be difficult to eliminate when making low-level measurements, both the picoammeters and electrometers are available in battery powered versions. All B2980A series products have a 4.3” liquid crystal display that supports a variety of viewing modes (numeric, trend chart and histogram), which eliminates the need to perform data analysis on a PC. These unique capabilities enable you to capture transient device and material behavior and to make quick statistical analyses on the spot, thereby greatly increasing measurement confidence and efficiency. Optional Setup Integrity Checker software is available to help you isolate the cause of noise arising from external setup elements, such as cables, connectors, adapters, chambers, etc. The B2980A series provides numerous unique, best-in-class capabilities that greatly improve your ability to make sensitive measurements.more...
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Polytec MSA-500 Micro System AnalyzerThe Micro System Analyzer is the premier measurement tool for the analysis and visualization of structural vibrations and surface topography in micro structures such as MEMS. By fully integrating a microscope with scanning laser doppler vibrometry, stroboscopic video microscopy and scanning white light interferometry, the Micro System Analyzer is designed with an all-in-one combination of technologies that clarifies real microstructural response and topography. **Polytec’s Award-Winning Micro System Analyzer** Incorporated in the MEMS design and test cycle, the MSA-500 provides precise 3-D dynamic and static response data that simplifies troubleshooting, enhances and shortens design cycles, improves yield and performance, and reduces product cost. This outstanding degree of innovation has been recognized by two prestigious awards: the 2005 Sensor Innovation Award and the Photonics Circle of Excellence for the development of microscope-based scanning vibrometry. **Superior Dynamic Characterization Compared to Single Technology Solutions** The combination of two complementary measurement techniques for investigating the vibrational behavior of small structures provides superior performance. For example, it can quickly identify, visualize and measure system resonances and transient responses, enhancing overall measurement productivity. This improved efficiency is especially important when integrating the measurement system into automated processes for MEMS production environments. Single-technology solutions like ESPI, white light interferometry, and phase-shifting interferometry give a much more limited view of small structure response. **Finds All Mechanical Resonances Without Prior Information** Using wide-band excitation, the highly sensitive laser-Doppler technique can rapidly find all mechanical resonances (in-plane and out-of-plane) without prior information. In a second step, stroboscopic video microscopy is used to obtain accurate amplitude and phase information of in-plane resonances identified through laser vibrometry.more...
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Polytec TopMap Micro.View®+**Polytec TopMap Micro.View®+** TopMap Micro.View+ is the next generation optical surface profiler. Designed for modularity, this comprehensive workstation allows for customized and application-specific configurations. The Micro.View + delivers the most detailed analysis of surface roughness, texture and microstructure topography. Combine 3D data with color information for amazing visualizations and extended analysis like detailed documentation of defects. The high-resolution 5 MP camera delivers incredibly detailed 3D data visualization of engineered surfaces. **Automation enabled and production-ready** The encoded and motorized turret secures a seamless transition between objectives. Micro.View+ features the latest Focus Finder plus Focus Tracker, keeping the surface in focus at all circumstances. The fully motorized sample positioning stages allow for stitching and automation. **Key Features & Specifications**: - High-end white-light interferometer with nm resolution - 100 mm z measurement range with CST Continuous Scanning Technology - With Focus Finder and Focus Tracker ready for automation - Motorized X, Y, Z, tip/tilt and turret save repositioning - Color information mode for extended analysis and documentation of defects - Modular, application-specific configurationsmore...